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PRODUCTS, SERVICES
Imaging, Cameras, Microscopes, Magnifiers
Microscopes: SEM Electron, TEM Electron
Scanningi Electronic Microscope
SEM scanning transmission electron microscopes, TEM transmission electron microscopes,tunneling electron microscope,atomic force microscope
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Showing 1-20
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 = product catalog / search specs
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Agilent Technologies - Acqiris - Test Measurement Instruments, Oscilloscopes, Power Meters, SEM, Stock Symbol A
Palo Alto, CA USA 650 752 5000 |
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Agilent $6.1 Billion sales 19,000 employees, World's largest manufacturer test measurement instruments, network spectrum alalyzers, oscilloscopes, protocol signal source analyzer, digital multimeters, voltmeters, signal waveform data generators
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Ambios Technology - Quesant Instruments - SPM Scanning Probe Microscopes, Stylus Profilometer, Private Ownership
Santa Cruz, CA USA 831 429 4200 |
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Ambios Technology non-destructive 3D surface measurement profilometers, non-contact optical profiler interferometers, AFM atomic force microscopes, SPM scanning probe
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Aspex - Quality Control Automated Particle Characterization Analysis, Scanning Electron Microscopes, Private Ownership
Delmont, PA USA 724.468.5400 |
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Asylum Research - Atomic Force Microscope, Vibration Isolation Table, 3-D Rendering Software, Private Ownership
Santa Barbara, CA USA 805 969 6466 |
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Evex Inc - Mini SEM Scanning Electron Microscopes, X-Ray Nanoanalysis Instrument , Private Ownership
Princeton, NJ USA 609 252 9192 |
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FEI Company - Nano Scale SEM Scanning Electron Microscope, TEM Transmission Electron Microscopes, Stock Symbol FEIC
Hillsboro, OR USA 503 726 7500 |
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FEI Company $590 Million sales 1800 employees, 3D microscopy material characterization systems, atomic scale nanoimage FIB focused gallium ion beam analysis semiconductor surface defect quality control inspection analysis, automated mineral analysis
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Hitachi High Technologies (HTA) - Transmission Electron Microscope Spectrometers HPLC Chromatography, Stock Symbol 8036 (Tokyo)
Minato ku, Tokyo Japan 81 3 3504 7111 |
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Hitachi High Technologies Semiconductor Manufacturing Equipment and Laboratory Spectrophotometer Instruments, Mercury Analyzer, HPLC, Microscopes, Karl Fischer Titration Instruments, 888 Billion Yen sales ($7.5 Billion US Dollars) 9,974 employees
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Hypres Inc - Superconducting Electronics, Wide Band Amplifiers, Squid Microscope, Optical Network, Private Ownership
Elmsford, NY USA 914.592.1190 |
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Jeol - Scanning Electron Microscopes SEM, Transmission Electron Microscopy TEM, Mass Spectrometers, Stock Symbol 6951(Tokyo), JELLF (ADR)
Tachikawa, Tokyo Japan 81.42.528.3363 |
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Jeol 115 Billion Yen ($1.1 Billion USD) 3100 employees, scanning NMR spectrometers, SPM probe, semiconductor electron beam lithography, elemental analysis X-Ray fluorescence spectrometers, clinical chemistry amino acid analyzer, thin film coating
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Obducat AB - Scanning Electron Microscopy, Lithography,
Malmo, Sweden 46.40.36.21.00 |
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Omicron NanoTechnology - Electron Spectrometer, LEED Low Energy Electron Diffraction, SEM, Private Ownership
Taunusstein Germany 49.6128.987.0 |
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Omicron NanoTechnology STM scanning tunneling microscopy, UHV nanoprobe system, magnetic force microscopy, spot profile analysis LEED, reflection high energy electron diffraction RHEED, electron microscopy SEM, scanning near field optical microscopy
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Pacific Precision Laboratories (PPLI) - Nano Zoom Disk Inspection Atomic Force Microscope, XYZ Stage, Previously JMAR Precision Systems Inc
Chatsworth, CA USA 818 700 8977 |
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RHK Technology Inc - Nanoscience UHF Ultra High Vacuum SPM Scanning Probe Microscopes, Private Ownership
Troy, MI USA 248 577 5426 |
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RHK Technology Inc scanning probe microscope manufacturer, multi-technique LEED scanning probe microscopy surface analysis, quadraprobe SPM, variable magnetic field AFM STM, modular UHV ultra high vacuum variable temperature microscopy SPM chambers
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Seiko - Scientific Instruments - Electron Microscope, XRF, Thermal Analysis, X-Ray Detector, ICP-MS, Stock Symbol 8050 (Tokyo)
Chiba-shi, Chiba Japan 81.43.211.7974 |
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Seiko Holdings Scientific Instruments, TEM transmission electron microscopy, SEM scanning electron microscopy, XRF coating thickness measurement, scanning probe microscope, thermal analyzers, scanning ion microscope, X-ray detector,
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Specs Scientific Instruments Inc - UHV Ultra High Vacuum Surface Analysis Instruments, Ion Source, Private Ownership
Sarasota, FL USA 941 362 4877 |
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Specs Scientific Instruments Inc UHV ultra high vacuum surface XPS analysis microscopy instruments, biological sample preparation chamber, hemispherical energy analyzers, diffractometers, mass spectrometer, SEM secondary electron detector, ion source
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TNP Instruments Inc - Liquid Crystal Display Test Measurement Equipment,
Carson, CA USA 310 532 2222 |
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Topcon - Sokkia - Survey Instruments, Refractometer, Slit Lamp, Microscope, Retinal Camera, Stock Symbol 7732 (Tokyo), TOPCF (ADR) 35% Toshiba
Itabashi-ku, Tokyo Japan 81.3.3558.2523 |
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Topcon 111 Billion Yen sales ($1.07 Billion USD) 5200 employees, electronic digital level, laser theodolite survey instrument, construction equipment GPS positioning, semiconductor inspection instruments, ophthalmic surgical microscope, 3D OCT
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Veeco Instruments - Nanoscale Molecular Beam Epitaxy , Semiconductor Metrology, Ion Beam Deposition, Stock Symbol VECO
Woodbury, NY USA 516 677 0200 |
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Veeco Instruments $422 Million sales, semiconductor ion beam etch deposition, lapping dicing systems, atomic layer deposition, epitaxial equipment MBE sources, components, semiconductor optical profiler, AFM atomic force microscope profiler AFP
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Witec Instruments - High Resolution Scanning Probe Confocal Raman Microscopes, AFM Atomic Force, Private Ownership
Ulm Germany 49.700.94832.366 |
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Zeiss (Carl Zeiss) - Industrial Metrology, Optics, Electron Microscopes, Binoculars, Riflescopes, Private Ownership
Jena, Germany 49.3641.220.105 |
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Carl Zeiss 2.6 Billion Euro sales ($3.6 Billion US Dollars) 12,257 employees, birding sport optic spotting scopes, hunting riflescopes, CMM coordinate measuring machines, spectral gratings, camera SLR lens, stereo microscopes, confocal, inverted
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