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Jordan Valley Semiconductors - Bede - Non Destructive X-Ray Thin Film Semiconductor Metrology
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| Private Ownership (Intel Capital Elron Electronic)
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8601 Cross Pk Dr #200
Austin, TX (USA) 78754
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| Phone: |
512 832 8470 |
| Fax: |
512 973 9282 |
| Toll Free: |
866.515.5200 |
| Company Description |
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Jordan Valley Semiconductors microelectronics XRR XRF metrology, high speed non-destructive thickness strain composition thin film measurement instruments, semiconductor lattice relaxation analysis |
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